Mitsuhiro
(Mitsu) Murayama is a research professor at Virginia Tech, concentrating
in the area of nano scale materials characterization using transmission
electron microscopy. He received his B.S, M.S. and Ph. D. (in 1996)
from the University of Tohoku, Japan. He had been a senior researcher
at the National Institute for Materials Science in Japan (one of
the worlds' largest materials science institutes) for 11 years and
has more than 17 years of research experience in nano-scale materials
characterization, with many of state-of-the-art analytical techniques,
including Rutherford backscattering spectroscopy, ion channeling
spectroscopy, field ion microscopy/atom probe and analytical electron
microscopy. He has maintained well-established collaborations with
academia and industry even after he moved on to the U.S. |
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Research
interests: Nanoscale materials characterization using
analytical transmission electron microscopy (TEM) and scanning transmission
electron microscopy (STEM) techniques. Understanding materials properties
– nanostructure relationships, including surface reduction/oxidation
(nanogeochemistry, corrosion, passivation), physical metallurgy
(phase transformation, precipitation), dynamic study of nano-particles
(in-situ heating, plasmon spectroscopy) and catalytic materials.
He currently enhances his efforts in applying electron energy loss
spectroscopy and STEM- tomography techniques to nanoscience and
nanogeochemistry problems.
He focuses
his teaching effort on practical transmission electron microscopy
(TEM). He enjoys teaching introductory level microscopy, electron
diffraction and electron-based spectroscopy to students never touch
electron microscopes.
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